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ElliottKasoar
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Thanks for this, @zwei-beiner! From a first pass, it looks really nice!
I've just left a few minor suggestions/requests.
The only other thing is I wonder if for convenience when choosing a test, we may want a slightly more concise name e.g. si_defects (since it's already in the nebs category), or do you think that's too vague?
Not a problem, but I'm also curious about some of the NEBs, in particular the 216 di-to-single, seem to show little-to-no change until very near the end of the NEB. Is this expected?
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The name
Yes that was the original NEB, the images are just clustered there. In principle I could remove very similar images as this gives a 5x speedup of the test, and currently we are just testing against energies and forces anyway. Only issue is that this would technically not be a NEB anymore which might become an issue if we want to do actual NEB relaxations with models later on (not just single point comparisons on a fixed NEB). Let me know if you think the NEB should be de-duplicated. |
Pre-review checklist for PR author
Summary
Adds a new NEB benchmark for silicon interstitials (MP0 A.1).
Linked issue
Resolves #317
Progress
Testing
Tested on CPU with:
New decorators/callbacks
None.