(last updated September 9, 2025)
This Python codebase is designed to process, analyze, and visualize current-voltage (ID-VG) sweep data collected from a semiconductor probe station (e.g. micromanipulator3000). It is primarily used for the investigation of electrical characteristics of devices with varying design parameters — such as well width/length (W/L) ratios, structural differences, concentrations of dopamine, and/or other fabrication design configurations.
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Automated Parsing of IV Sweep Data
Takes in semi-raw.csvfiles containing multiple device sweeps and extracts blocks of measurement data based on user-defined parameters. For dataset comparisons, users must make multiple.csvfiles from the raw file to separate each configuration. -
Parameter Extraction
For each device sweep, it computes key transistor characteristics including:- Threshold voltage (Vth)
- Transconductance (gm)
- Subthreshold swing (SS)
- Locally minimum current from the positive side (Imin)
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Data Filtering and Plotting
Supports plotting both raw and log-scale ID-VG curves. You can filter the datapoints with theIV_filters.pymodule. -
Comparative Boxplots
After collecting parameter data across devices, the tool generates boxplots for visual statistical comparison of configurations (e.g., W/L ratios, structural variations like nanowells, etc.) of the most recent two configurations you have inputted.
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CSV Input
You provide a CSV file containing multiple blocks of device sweep data. Each block corresponds to one sweep of VG. -
Interactive Configuration
At runtime, you're prompted to specify:- Number of configurations to compare (at zeroth iteration only)
- CSV file path (repeated)
- Block size (lines per measurement block, repeated if necessary)
- Number of graphs (device sweeps) to analyze per configuration (repeated if necessary)
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Graphing & Analysis
The script parses each block, generates a log-scale and/or a non-log ID-VG plot, computes characteristic parameters, and stores the results in a console-printed format. -
Visualization Summary
Once all configurations are processed, the tool creates scatter plots comparing each extracted parameter across the different configurations.