Die Yield v1.0.0: Interactive and Real-Time Wafer Yield Estimation Tool

Features

• Interactive Input: Easily adjust die size, wafer diameter, edge exclusion, and other critical parameters.
• Real-time Calculation: Instantly see how parameter changes affect the die yield.
• Visual Wafer Map: A color-coded representation of die placement on the wafer, including good, partial, and excluded dies.
• Yield Estimation: Calculate the estimated yield based on defect density.
• Responsive Design: Works seamlessly on desktop and mobile devices.